• 2020.09.18

    XOPT2021 website open.

Important Dates

Abstract Submission Open:
October 14, 2020
Registration Opens:
December 18, 2020
Abstract Submission Deadline:
January 16, 2021

Conference format

Hybrid fashion combining “real” and “digital/virtual” formats

As we recognize that travel conditions in 2021 spring are uncertain, XOPT2021 will be organized in a hybrid fashion, combining “real” and “digital/virtual” formats.
For the “real” format, we plan to convene a few in-person meetings at certain venues, such as Osaka, Tokyo, etc in Japan.
For the “digital/virtual” format, the presentations and discussions at the in-person meetings will be connected via the on-line conferencing and video archive systems for participants unable to attend the meetings in-person.

We strive to significantly promote sharing the latest status of X-ray technology and discussion on the plans for the future, and so we are pleased that the meeting will still run this year with the revised format.
We are looking forward to seeing you at least on screen in April 2021.
More information will be continually updated in this website. But please SAVE THE DATE already.

Presentation style


Conference Chairs

Tetsuya IshikawaRIKEN

Kazuto YamauchiOsaka University

Co-Sponsored by

  • RIKEN SPring-8 Center
  • Research Center for Ultra-Precision Science & Technology. Osaka Univ.
  • Technical Committee for Ultraprecision Machining of JSPE


XOPT covers the recent progress of X-ray technology and developments with topics including the following fields:

  • X-ray optical components

    • High-resolution monochromators
    • High-resolution spectrometers/analyzers
    • Optics for high-energy X-ray applications
    • Beamline monochromators/mirrors
    • Focusing optics (reflective, refractive, diffractive)
    • Phase retarders and polarization optics
    • Diagnostics tools
    • New optics for diffraction-limited synchrotron radiation (DLSR)
  • Methods/applications

    • X-ray imaging/microscopy
    • X-ray inelastic scattering
    • Time resolved analysis
    • X-ray correlation spectroscopy
    • Nonlinear X-ray optics
    • New Methods/applications for DLSR
  • Others

    • X-ray sources
    • X-ray detectors