XOPT will be presented in a hybrid format, combining in-person and virtual presentations.
If your paper is accepted, we will ensure a platform for it to be presented.

Important Dates

Abstract Submission Open:
November 2, 2021
Submission deadline:
January 28, 2022
Registration Open:
January 17, 2022

Conference format

Hybrid fashion combining “real” and “digital/virtual” formats

XOPT2022 will be organized in a hybrid fashion, combining “real” and “digital/virtual” formats.
For the “real” format, we plan to convene an in-person meeting at PACIFICO Yokohama.
For the “digital/virtual” format, the presentations and discussions at the in-person meetings will be connected via the on-line conferencing and video archive systems for participants unable to attend the meetings in-person.

We strive to significantly promote sharing the latest status of X-ray technology and discussion on the plans for the future, and so we are pleased that the meeting will still run this year with the revised format.
We are looking forward to seeing you at PACIFICO Yokohama in April 2022.
More information will be continually updated in this website. But please SAVE THE DATE already.

Presentation style

Oral (real & virtual)


Conference Chairs

Tetsuya IshikawaRIKEN

Kazuto YamauchiOsaka University

Co-Sponsored by

  • RIKEN SPring-8 Center
  • Research Center for Precision Engineering. Osaka Univ.
  • Technical Committee for Ultraprecision Machining of JSPE


XOPT covers the recent progress of X-ray technology and developments with topics including the following fields:

  • X-ray optical components

    • High-resolution monochromators
    • High-resolution spectrometers/analyzers
    • Optics for high-energy X-ray applications
    • Beamline monochromators/mirrors
    • Focusing optics (reflective, refractive, diffractive)
    • Phase retarders and polarization optics
    • Diagnostics tools
    • New optics for diffraction-limited synchrotron radiation (DLSR)
  • Methods/applications

    • X-ray imaging/microscopy
    • X-ray inelastic scattering
    • Time resolved analysis
    • X-ray correlation spectroscopy
    • Nonlinear X-ray optics
    • New Methods/applications for DLSR
  • Others

    • X-ray sources
    • X-ray detectors

Sponsor Companies