Important Dates

Abstract Submission Deadline:
December 14, 2018, Friday Extended to January 30, 2019, Wednesday
Registration Opens:
December 17, 2018, Monday
Early Bird Registration Deadline:
April 8, 2019, Tuesday

Presentation style

Oral presentations

Invited talks: 30 minutes (include discussion)
Contributed talks: 15 minutes (include discussion)
Company session: 10 minutes (without discussion)

Poster presentations

Poster board size is 90 cm (Horizontal) x 210 cm (Vertical)

Welcome address

We are pleased to host the International Conference on X-ray Optics and Applications (XOPT2019) as part of the Optics and Photonics International Congress 2019 (OPIC2019) in Yokohama, Japan.

X-rays have played a vital role in a number of breakthrough scientific discoveries in recent years. Continuous innovations in X-ray optics, methodologies, and beamline instruments have laid the foundation for these achievements. For this conference, we are inviting leading experts in these fields from around the world to share the latest status of X-ray technology and developments and to discuss their plans for the future. One important topic we would like to discuss is how state-of-the-art X-ray optics can contribute to exploring the potential of the DLSR (Diffraction-Limited Synchrotron Radiation) sources that are currently emerging.

As a part of OPIC2019 on April 22-26, 2019, participants in XOPT2019 will have a full access to all the other concurrent conferences, events and exhibition (OPIE2019). See for details.

We are happy to welcome you to participate in and enjoy the conference.

Conference Chairs

Tetsuya IshikawaRIKEN

Kazuto YamauchiOsaka University

Co-Sponsored by

  • RIKEN SPring-8 Center
  • Research Center for Ultra-Precision Science & Technology. Osaka Univ.
  • Technical Committee for Ultraprecision Machining of JSPE


XOPT covers the recent progress of X-ray technology and developments with topics including the following fields:

  • X-ray optical components

    • High-resolution monochromators
    • High-resolution spectrometers/analyzers
    • Optics for high-energy X-ray applications
    • Beamline monochromators/mirrors
    • Focusing optics (reflective, refractive, diffractive)
    • Phase retarders and polarization optics
    • Diagnostics tools
    • New optics for diffraction-limited synchrotron radiation (DLSR)
  • Methods/applications

    • X-ray imaging/microscopy
    • X-ray inelastic scattering
    • Time resolved analysis
    • X-ray correlation spectroscopy
    • Nonlinear X-ray optics
    • New Methods/applications for DLSR
  • Others

    • X-ray sources
    • X-ray detectors

Sponsor Companies