Information

Important date

Abstract Due Date:
Dec. 14 2017, Thursday Abstract Submission Extened 26th January 2018.
Registration Start:
Dec. 15, 2017, Friday
Early Bird Registration Ends:
April 5, 2018, Thursday

Notice

XOPT has no plan to publish conference papers in a journal.

Welcome address

We are pleased to host the International Conference on X-ray Optics and Applications (XOPT2018) as part of the Optics and Photonics International Congress 2018 (OPIC2018) in Yokohama, Japan.

X-rays have played a vital role in a number of breakthrough scientific discoveries in recent years. Continuous innovations in X-ray optics, methodologies, and beamline instruments have laid the foundation for these achievements. For this conference, we are inviting leading experts in these fields from around the world to share the latest status of X-ray technology and developments and to discuss their plans for the future. One important topic we would like to discuss is how state-of-the-art X-ray optics can contribute to exploring the potential of the DLSR (Diffraction-Limited Synchrotron Radiation) sources that are currently emerging.

We are happy to welcome you to participate in and enjoy the conference.

Conference Chairs

Tetsuya IshikawaRIKEN

Kazuto YamauchiOsaka University

Co-Sponsored by

RIKEN SPring-8 Center
Research Center for Ultra-Precision Science & Technology. Osaka Univ.
Technical Committee for Ultraprecision Machining of JSPE

Scope

XOPT covers the recent progress of X-ray technology and developments with topics including the following fields:

X-ray optical components

  • High-resolution monochromators
  • High-resolution spectrometers/analyzers
  • Optics for high-energy X-ray applications
  • Beamline monochromators/mirrors
  • Focusing optics (reflective, refractive, diffractive)
  • Phase retarders and polarization optics
  • Diagnostics tools
  • New optics for diffraction-limited synchrotron radiation (DLSR)

Methods/applications

  • X-ray imaging/microscopy
  • X-ray inelastic scattering
  • Time resolved analysis
  • X-ray correlation spectroscopy
  • Nonlinear X-ray optics
  • New Methods/applications for DLSR

Special topics

  • Multidimensional imaging and analysis

Others

  • X-ray sources
  • X-ray detectors

Sponsor Companies

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