Conference
Invited speakers
Lahsen Assoufid (Argonne National Laboratory)
Development of a hard X-ray non-invasive wavefront sensor using a single-grating interferometer combined with a thin diamond single-crystal beam splitter
Peter Cloetens (European Synchrotron Radiation Facility)
X-ray nano-imaging and nano-analysis using multilayer coated Kirkpatrick-Baez optics
Nathalie Bouet (Brookhaven National Laboratory)
Multilayer Laue Lens Fabrication and Measurement Results
Robert Feidenhans’l (European XFEL)
European XFEL – New Opportunities for X-ray Science
Manuel Guizar-Sicairos (Paul Scherrer Institut)
Ptychographic X-ray computed tomography – An outlook for diffraction-limited sources
Jangwoo Kim (Pohang Accelerator Laboratory)
Hard X-ray focusing optics and applications at the PAL-XFEL
Takashi Kimura (Hokkaido University)
Radiation-Damage-Free Imaging of Solid Electrolytes for Lithium-Ion Batteries by Single-Shot Coherent Diffraction Imaging
Taito Osaka (SACLA)
Recent Progress of SACLA
Oleg G. Shpyrko (University of California San Diego)
Coherent X-ray Diffractive Imaging of Topological Defects in Operando Energy Storage Materials
Hugh Simons (Technical University of Denmark)
Multi-Scale 3D Imaging of Strains and Structures with Dark-Field X-Ray Microscopy
Anatoly Snigirev (Immanuel Kant Baltic Federal University)
X-ray refractive beam-conditioning and beam-shaping optics for coherent microscopy applications
Wataru Yashiro (Tohoku University)
Recent Advance and Future Potential in X-ray Imaging with Gratings
Diling Zhu (SLAC)
Status and Developments in Crystal Optics at the Linac Coherent Light Source